The present disclosure pertains to a method of preparing a test specimen for testing of the bonding strength of a layer of additive material to a crystalline substrate, or testing of the bonding strength of one layer of additive material to a second layer of additive material, where both layers of additive material overlie a crystalline substrate. The method includes both test specimen "cutting" from a large sample of material and preparation of an individual test specimen for four-point adhesion testing. Also described is a fixture which is useful for cutting the individual test specimen from the large sample of material.
RELATED APPLICATIONS
This application is a divisional of U.S. Application Ser. No. 10/629,071, filed Jul. 28, 2003 now U.S. Pat. No. 6,790,707, which is a continuation-in-part of U.S. application Ser. No. 10/435,306, filed May 9, 2003, which is abandoned.
