Systems and methods for testing a circuit are provided. In one example, a sequential device for use in a scan chain is described. The sequential device may include a scan input, a scan output and a functional data output. The functional data output may be coupled to the scan input and to the scan output. The functional data output may be coupled to the scan output via a delay buffer.
RELATED APPLICATIONS
This application makes reference to, claims priority to and claims benefit from U.S. Provisional Patent Application Ser. No. 60/361,004, entitled "Slow Scan Output," filed on Mar. 1, 2002.
