A program-controlled unit is described. The program-controlled unit has a central processing unit (CPU), peripheral units that are connected to the CPU via an internal bus, and debug resources that can be used to trace and influence operations taking place in the program-controlled unit. The program-controlled unit that is described is characterized in that the debug resources and the peripheral units, which output data from the program-controlled unit and/or can receive and pass on data which is supplied to the program-controlled unit from the outside, are connected to one another via a second internal bus. The data that is to be transmitted between the debug resources and devices provided outside the program-controlled unit are transmitted via the second internal bus and individual, a plurality of, or all the peripheral units connected thereto.
The invention relates to a method and an arrangement of testing a device, such as a peripheral device, in a mobile station. The arrangement comprises a signal generator for generating a test signal for the device under test, a measurement unit integrated into the mobile station for measuring en electric quantity from a feeding line of the device under test, and an analyser for determining an electric response of the device to the test signal by using the electric quantity. According to the invention, at least a portion of the testing procedure composed of generating the test signal and determining the electric response of the device is performed using a functional unit, such as the signal generator or the analyser, integrated into the mobile station.
