A system and method for reducing the amount of time for a boot operation is provided that includes a test management module that divides the memory into multiple test blocks and then selects a limited number of test blocks to test during a boot operation, thereby decreasing the overall amount of memory test time.
A system, method and software for isolating information handling system memory system devices are disclosed. In dual-channel double-data-rate memory system implementations, teachings of the present disclosure facilitate accurate identification of memory system devices that fail diagnostic testing or cause memory errors. A BIOS level application is provided which permits user or application selection and isolation of memory system devices or components, thereby eliminating the need for physical removal of such components during testing as well as permitting continued use of the information handling system with defective memory system devices isolated.
In accordance with the teachings of the present disclosure, a system and method for reducing the amount of time for a boot operation is provided that substantially reduces disadvantages and problems associated with previously developed memory testing systems and methods. The system includes using a shutdown memory test module to perform the bulk of memory testing during system shutdown, rather than at system start up.
