Optically stimulated luminescence radiation dosimetry method to determine integrated doses and dose rates and a method to extend the upper limit of measureable absorbed radiation doses during irradiation
There is provided herein a system and method for obtaining measurements of radiation exposure in real time using OSL and for obtaining improved accurate OSL measurements over a greater range of radiation exposures. In a preferred embodiment a signal-versus-dose response is obtained from an OSL dosimeter that is linear over all doses and does not exhibit saturation effects. The desired response is preferably calculated from the measured OSL-versus-time response from a suitable dosimeter obtained during irradiation. To obtain the desired response from the measured OSL data each measured OSL point has to be corrected for the depletion of the trapped electron concentration that occurs during each illumination period.
CROSS REFERENCE TO RELATED APPLICATION
This application claims the benefit of U.S. Provisional Application No. 60/473,662, which application was filed with the Patent and Trademark Office on May 23, 2003, which application is hereby incorporated by reference.
