A high-speed sampling system and an analog to digital converter are disclosed. One embodiment of a method of sampling a signal includes receiving an analog signal and generating first samples at a rate of Fs, and generating second sub-samples from the first samples at a rate of Fs/N and having a relative phase of approximately (360/N)*(i-1) degrees, where i varies from 1 to N. In a first embodiment, at most two second sub-samplers are tracking the output of the first sampler at any point in time. In a second embodiment, only one of the N second sub-samplers are tracking the output of the first sampler at any point in time. A third embodiment further includes generating third samples from the second samples at a rate of Fs/N, and having a relative phase of approximately ((360/N)*(i-1)+180) degrees. A method of interleaved analog to digital converting includes corresponding time interleaved ADCs receiving the third samples.

A signal sampling system includes an input signal and a plurality of samplers. The plurality of samplers produces a plurality of sample output signals. Each sampler from the plurality of samplers samples the input signal to produce a corresponding sample output signal from the plurality of sample output signals. Each sampler samples the input signal with a sampling pulse having a sampling aperture. A first sampling aperture used by a first sampler from the plurality of samplers to sample the input signal differs in duration from a second sampling aperture used by a second sampler from the plurality of samplers to sample the input signal.