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Reducing particle generation during sputter deposition
   
Document Number
US Patent 7041200
Issued Date
May 9, 2006
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Abstract
In a magnetron sputtering chamber, a substrate is placed in the chamber and a deposition shield is maintained about the substrate to shield internal surfaces in the chamber. The deposition shield has a textured surface that may be formed by a hot pressing process or by a coating process, and that allows the accumulated sputtered residues to stick thereto without flaking off. An electrical power is applied to a high density sputtering target facing the substrate to form a plasma in the chamber while a rotating magnetic field of at least about 300 Gauss is applied about the target to sputter the target. Advantageously, the sputtering process cycle can be repeated for at least about 8,000 substrates without cleaning the internal surfaces in the chamber, and even while still generating an average particle count on each processed substrate of less than 1 particle per 10 cm.sup.2 of substrate surface area.
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Number of Claims:
28
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Owner
Applied Materials, Inc. (Santa Clara, CA)
Published
May 9, 2006
Application Number
10/126,333
Filed
April 19, 2002
US Classification
204/192.12   204/192.13 204/192.17 204/298.11 204/298.12 204/298.13 204/298.19 204/298.2
Int'l Classification
C23C   14/35   (20060101)  
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USPTO Field of Search
204/192.12   204/192.13   204/298.11   204/298.12   204/298.13   204/298.19   204/298.2   204/192.17  
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