Pattern projection apparatuses are placed on each other in a stack manner in a stripe pattern direction for projecting the same patterns. An image pickup apparatus (camera 1) is placed between the pattern projection apparatuses. The optical axes of the pattern projection apparatuses and the image pickup apparatus are aligned on the same plane parallel with the stripe pattern direction. On the plane, the principal points also become the same. An image of a stripe pattern is picked up directly by the image pickup apparatus without the intervention of a half mirror, etc., and is recoded. An image of the recoded stripe pattern is picked up by an image pickup apparatus (camera 2) and is decoded and the range of an object is measured by triangulation based on image correspondence points.
This is a continuation-in-part application of application Ser. No. 10/373,761 filed Feb. 27, 2003.
The present disclosure relates to the subject matter contained in Japanese Patent Application No. 2002-248034 filed on Aug. 28, 2002 and Japanese Patent Application No. 2003-299505 filed on Aug. 25, 2003, which are incorporated herein by reference in its entirety.
Priority Data
Aug 28, 2002 [JP] 2002-248034 Aug 25, 2003 [JP] 2003-299505
