A new method and system of testing and classifying semiconductor devices is provided. User requirements are collected for this purpose, test specifications and test functions are defined for the to be tested DRAM devices. The Automatic Classification Shipping (ACS) data base is updated with test related data, the testing is performed whereby DRAM devices are assigned categories from with DRAM classes are derived. These identified classes are used to sort the tested DRAM devices in accordance with their tested functional performance characteristics.
