A DC symmetrical FET switch includes second and third switches connecting the well of the symmetrical FET switch to the drains and the source when the symmetrical FET switch is on. When the three FET's are on, the well, source and drain of the symmetric FET switch all exhibit the same input signal, wherein the drains and source to well capacitances are substantially prevented from draining off any of the input signal, thereby increasing the bandwidth and decreasing the insertion loss of the switch. The second and third switches are also FET switches. An enable signal is connected to the gates of all three FET's turning them on and off together. When the enable is false the FET switches are turned off and their wells are driven to a potential a proper potential. When the FET's are n-type the potential is low and when the FET's are p-types the potential is high. A resistor is provided in the gate drive of the first FET switch that further increases bandwidth and decreases insertion loss of the switch by moving the break frequency of the drain and source to gate capacitances.
Apparatus and methods are disclosed for improving the performance of a programmable logic device (PLD). A PLD includes a memory cell configured to provide a pair of voltages to a gate of a pass transistor and a body of the pass transistor, respectively.
An FET switch comprising a single or parallel opposite polarity FETS is illustrated with wells that are driven from internal power rails. The internal power rails are logically coupled by other driving FET switches to, in one case, the higher of a positive power supply or signal level wherein the well of the PMOS FET switch will not allow the drain/source to well diode to be forward biased. In a second case, a second power rail is logically coupled to the lower of either and input signal or ground, wherein the well of the NMOS FET will not allow the drain/source to well diode to be forward biased.
A circuit device having a transistor-based switch topology that substantially eliminates the possibility of latchup of the device. A series-connected low voltage threshold (LVT) N-channel transistor and a pull-up resistor are coupled across a switching (P-channel) transistor so that an integral body connection is provided for the switching transistor, which connects the body of the switching transistor to a node between the pull-up resistor and source terminal of the LVT transistor. The LVT transistor is connected with its gate and drain terminal connected to the output terminal of the switching transistor. The resistor is connected at its other end to the power supply side terminal of the switching transistor. The addition of these components in the particular configuration allows the body connection of the switching transistor to be automatically switched to the highest potential diffusion node.
A pass-gate having a single or parallel opposite polarity FETs is disclosed. The wells of the primary transistor switches are driven from circuitry that reduces over-voltage leakage and other malfunctions. A circuit that drives the wells is also used to power enable circuits that drive the gates of the pass transistors. The use of separate circuits to the gate and the wells further reduces leakage. In the condition of power supply voltage and signal levels that are near the thresholds of the FETs involved, one or more Schottky diodes may be used across pn junctions in the FETs that will prevent turning on the pn junctions.
