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Deposition process for high aspect ratio trenches
   
Document Number
US Patent 7097886
Issued Date
August 29, 2006
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Abstract
A method of depositing an insulating film over a substrate having a gap formed between two adjacent raised features. The method includes depositing one portion of the insulating film over the substrate and in the gap using a high density plasma process that has simultaneous deposition and sputtering components and depositing another portion of the insulating film over the substrate and in the gap using an atomic layer deposition process. In some embodiments the portion of the film deposited by an atomic layer deposition process is deposited over the portion of the film deposited using a high density plasma CVD technique. In other embodiments, the portion of the film deposited by a high density plasma CVD process is deposited over the portion of the film deposited using an atomic layer deposition process.
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Number of Claims:
19
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Owner
Applied Materials, Inc. (Santa Clara, CA)
Published
August 29, 2006
Application Number
10/319,827
Filed
December 13, 2002
US Classification
427/569   257/E21.279 257/E21.548 427/576
Int'l Classification
H05H   1/24   (20060101)  
Examiner
USPTO Field of Search
427/569   427/576   427/579   427/255.31  
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