Testing of integrated circuit devices

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United States Patent

7103815

Link to this page

http://www.wikipatents.com/7103815.html

Inventor(s)

Ong; Adrian E. (Pleasanton, CA), Ho; Fan (San Ramon, CA)

Abstract

An integrated circuit device includes a data buffer, coupled to an external connector, providing a data signal on the external connector. A test buffer, coupled to the data buffer, receives the data signal and provides a testing output signal to a delay circuit. The delay circuit receives the testing output signal at a first clock rate internal to the integrated circuit device and compares test data in the testing output signal to expected test signal values. The delay circuit provides a result to an external connector at a second clock rate that is slower than the first clock rate.

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Reference	Relevancy	Comments	Reference	Relevancy	Comments
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