A multiple-LED sensor is used to detect area coverage of marked patches on a marking substrate. The same sensor may also be used for color calibration. The marking substrate area coverage sensor obtains reflectance measurements from marked patches of a marking substrate. For example, the marked patches may be patches of a marking substance such as toner, ink or paint, or patches marked by etching or the like. A Neugebauer model may be used to obtain the reflectance measurements. A batch least squares algorithm may be used to estimate the appropriate parameters of the Neugebauer model. For improved accuracy, a recursive least squares algorithm may be used. The recursive least squares algorithm allows the marking substrate area coverage sensor to calibrate itself to changes in the sensing environment.
