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Apparatus and method for simulating a battery tester with a fixed resistance load
   
Document Number
US Patent 7116109
Issued Date
October 3, 2006
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Inventors
Klang; James K. (Downers Grove, IL)
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Abstract
A method and apparatus for simulating a battery tester with a fixed resistance load, such as a widely used Japanese load tester that rates the strength of Japanese batteries that are categorized under the Japanese Industrial Standard (JIS), are provided. This invention simulates such a device without invoking large current loads, yields familiar results, utilizes an existing database and provides more conclusive testing. The method includes measuring an open circuit voltage (OCV), temperature and a dynamic parameter of the battery. A load voltage of the battery is estimated as a function of the measured battery dynamic parameter, the OCV, the load resistance value of the load tester and the battery temperature. A bounceback voltage (BBV) of the battery is then predicted. The BBV, the load voltage and the battery temperature are utilized to rate the strength of the battery.
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Number of Claims:
16
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Owner
Midtronics, Inc. (Willowbrook, IL)
Published
October 3, 2006
Application Number
10/705,020
Filed
November 11, 2003
US Classification
324/426   324/425
Int'l Classification
G01N   27/416   (20060101)  
Examiner
Assistant Examiner
Attorney/Law Firm
USPTO Field of Search
324/426   702/63  
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