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| | Reference | Relevancy | Comments | Reference | Relevancy | Comments | 2005/0046858 Hanson et al.
Mar,2005 |      Your vote accepted [0 after 0 votes] | | 2005/0046857 Bingham et al.
Mar,2005 |      Your vote accepted [0 after 0 votes] | | 6809845 Kim et al.
Oct,2004 |      Your vote accepted [0 after 0 votes] | | 2004/0213464 Hanson et al.
Oct,2004 |      Your vote accepted [0 after 0 votes] | | 2004/0213462 Hanson et al.
Oct,2004 |      Your vote accepted [0 after 0 votes] | | 2004/0145745 Voelkl
Jul,2004 |      Your vote accepted [0 after 0 votes] | | 2004/0130762 Thomas et al.
Jul,2004 |      Your vote accepted [0 after 0 votes] | | 6747771 Thomas et al.
Jun,2004 |      Your vote accepted [0 after 0 votes] | | 2004/0066518 Kreuzer
Apr,2004 |      Your vote accepted [0 after 0 votes] | | 2004/0042056 Price et al.
Mar,2004 |      Your vote accepted [0 after 0 votes] | | 2004/0057089 Voelkl
Mar,2004 |      Your vote accepted [0 after 0 votes] | | 2004/0042015 Price
Mar,2004 |      Your vote accepted [0 after 0 votes] | | 2004/0021871 Psaltis et a.
Feb,2004 |      Your vote accepted [0 after 0 votes] | | 2003/0227658 Thomas et al.
Dec,2003 |      Your vote accepted [0 after 0 votes] | | 6525821 Thomas et al.
Feb,2003 |      Your vote accepted [0 after 0 votes] | | 2003/0016364 Thomas et al.
Jan,2003 |      Your vote accepted [0 after 0 votes] | | 6597446 Klooster et al.
Oct,2002 |      Your vote accepted [0 after 0 votes] | | 6262818 Cuche et al.
Jul,2001 |      Your vote accepted [0 after 0 votes] | | 6078392 Thomas et al.
Jun,2000 |      Your vote accepted [0 after 0 votes] | | 5995251 Hesselink et a.
Nov,1999 |      Your vote accepted [0 after 0 votes] | | 5877873 Bashaw et a.
Mar,1999 |      Your vote accepted [0 after 0 votes] | | 5671042 Sciammarella
Sep,1997 |      Your vote accepted [0 after 0 votes] | | 5515183 Hashimoto
May,1996 |      Your vote accepted [0 after 0 votes] | | 5410397 Toeppen
Apr,1995 |      Your vote accepted [0 after 0 votes] | | 5339152 Horn
Aug,1994 |      Your vote accepted [0 after 0 votes] | | 5299035 Leith et al.
Mar,1994 |      Your vote accepted [0 after 0 votes] | | 4812042 Yokokura et al.
Mar,1989 |      Your vote accepted [0 after 0 votes] | | | | | |
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| | Reference | Relevancy | Comments | Khare K et al. "Direct sampling and demodulation of carrier-frequency signals" Optics Communications, North-Holland Publishing Co. Amsterdam, NL, vol. 211, No. 1-6, (Oct. 1, 2002), pp. 85-94, XP004382791 ISSN: 0030-4018. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Pedrini G. et al. "Quantitative evaluation of two-dimensional dynamic deformations using digital holography" Optics and laser technology, Elsevier Science Publishers BV., Amsterdam, NL, vol. 29, No. 5, (Jul. 1997), pp. 249-256, XP004090206 ISSN:
0030-3992. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Invention of Holography: D. Gabor, Proc. Roy. Soc. London Ser. A A197, 459 (1949). cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Invention of Sideband (Hetrodyne) Holography: E. Leith and J. Upatnieks, J. Opt. Soc. Am. 52, 1123 (1962) and J. Opt. Soc. Am. 53 1377 (1963). cit- ed by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Mathematical Treatise on Holography: J.B. Develis and G.O. Reynolds, Theory and Application of Holography, Addison-Wesley, Reading, MA, 1967. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Holographic Interferometry: L.O. Heflinger, R.F. Wuerker, and R.E. Brooks, J. Appl. Phys. 37, 642 (1966). cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Discussion of Focused Holography (used for holographic interferometry): F.E. Jahoda, R.A. Jeffries and G.A. Sawyer, Appln. Opt. 6, 1407 (1967). cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Interferogram Analysis: Digital Fringe Pattern Measurement Techniques, M. Kujawinska, (edited by D.W. Robinson and G.T. Reid), IOP Publishing Ltd., Bristol, England, 1993). cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Holographic Interferometry: Principles and Methods, K. Creath and T. Kreis (edited by K. Rastogi), Springer-Verlag, New York, New York, 1994. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Papers by E. Voelkl on Fourier transform analysis of electron holography: E. Voelk, L.F. Allard, and B. Frost, J. Microscopy 180, pt. 1, Oct., 1995, pp. 39-50. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | E. Voelkl, L.F. Allard, A. Datye, B. Frost, Ultramicroscopy 58, (1995), pp. 97-103. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Edgar Volkl, "Introduction to Electron Holography", pp. 133-138, published by Kluwer Academic/Plenum Publishers, New York, 1999. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Jacob et al., "High Resolution Photomask Transmission and Phase Measurement Tool", Metrology, Inspection and Process Control for Microlithography XVI, Proceedings of SPIE vol. 4689, pp. 70-82, 2002. cit- ed by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Thomas et al., "Direct to Digital Holography for Semiconductor Wafer Defect Detection and Review", Design, Process Integration, and Characterization for Microelectronics, Proceedings of SPIE vol. 4692, pp. 180-194, 2002. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | E. Voelkl, L.F. Allard, ICEM-13 (13th International Conference on Electron Microscopy), Jul. 17-22, 1994, Paris, France, Proceedings, p. 287. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Volkl, E., et al. "Advanced Electron Holography: A New Algorithm for Image Processing and Standardized Quality Test for the FEG Electron Microscope", ULTRAMICROSCOPY 58 (1995) 97-103. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Volkl, E., et al., "A Software Package for the Processing and Reconstruction of Electron Holograms", Journal of Microscopy, vol. 180, pt. 1, Oct., 1995, pp. 39-50. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Leith, E.N. "Reconstructed Wavefronts and Communication Theory", Journal of Optical Society of America, vol. 52 No. 10, Oct. 1962. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Gabor, D., et al., "Microscopy by Reconstructed Wave-Fronts", Research Laboratory, Aug. 1948, pp. 454-487. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Leith, E.N., et al., "Wavefront Reconstruction with Continuous-Tone Objects", Journal of The Optical Society of America, vol. 53, No. 12, Dec. 1963. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Leith, E.N., et al., "Wavefront Reconstruction with Diffused Illumination and Three Dimensional Objects", Journal of the Optical Society of America, vol. 54, No. 11, Nov. 1964. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | North, J.C., et al., "Holographic Interferometry", Journal of Applied Physics, vol. 37, No. 2, Feb. 1966. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Kujawinska, M., "Digital Fringe Pattern Measurement Techniques", Interferogram Analysis. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | DeVelis, J.B., et al., "Theory and Applications of Holography", (1967). cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Jahoda, F.C., et al., "Fractional-Fringe Holographic Plasma Interferometry", Applied Optics, Aug. 1967, vol. 6, No. 8, pp. 1407-1410. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Jahoda, F.C., et al., "Holographic Interferometry Cookbook", Los Alamos Scientific Laboratory, Oct. 1972. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Rastogi, P.K., "Holographic Interferometry", Optical Science Center, University of Arizona, vol. 68 (1994). cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Volkl, E., et al., "The Extended Fourier Algorithm. Application in Discrete Optics and Electron Holography", High Temperature Materials Laboratory, Jul. 1994. cited by other. Oct,2006 |      Your vote accepted [0 after 0 votes] | | International Search Report from PCT/US2004/012710, Jan. 7, 2005. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Written Opinion of the International Searching Authority from PCT/US2004/012710, Jan, 7, 2005. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | International Search Report from PCT/US2004/012798, Feb. 16, 2005. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Mendoza Santoyo F. et al. "Multi-pulsed digital holography applied to full 3D measurements of dynamic events" Proceedings of the SPIE--The International Society for Optical Engineering SPIE-INT. Soc. Opt. Eng. USA, vol. 4420, (Oct. 15, 1999), pp.
132-138, XP002311234 ISSN: 0277-786X. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | International Search Report from PCT/US2004/012618, Feb. 21, 2005. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Written Opinion of the International Searching Authority from PCT/US2004/012618, Feb. 21, 2005. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Mendoza Santoyo F. et al. "Multi-pulsed digital holography applied to full 3D measurements of dynamic events" Proceedings of the SPIE--The International Society for Optical Engineering SPIE-INT. Soc. Opt. Eng. USA, vol. 4420, (Oct. 15, 1999), pp.
132-138, XP002311234 ISSN: 0277-786X. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Pedrini G. et al. "Pulsed digital holographic interferometry with 694- and 347-nm wavelengths" Applied Optics, Optical Society of America, Washington, US, vol. 39, No. 2, (Jan. 10, 2000), pp. 246-249, XP000940114 ISSN: 0003-6935. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Thomas C. E. et al. "Direct to digital holography for high aspect ratio inspection of semiconductor wafers" AIP Conference Proceedings, American Institute of Physics, New Yourk, NY, US, No. 683, (Mar. 24, 2003), pp. 254-270, XP009031538 ISSN:
0094-243X. cited by other
. Oct,2006 |      Your vote accepted [0 after 0 votes] | | Kruschke O. et al. Holographic interferometic microscope of complete displacement determination: Optical Engineering SPIE USA, vol. 36, nol. 9, (Sep. 1997), pp. 2448-2456, XP002316736 ISSN: 0091-3286. cited by othe- r
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