A circuit inspection method includes supplying electric charges to a first, second, and third electric charge holding electrodes in an electric circuit; outputting the electric charges held in the first electric charge holding electrode after a predetermined period of time from supplying of the electric charges; changing voltages of the first and second scan lines to a drive voltage to output the electric charges held in the second electric charge holding electrode; and determining whether an electric charge writing function and an electric charge holding function of the second electric charge holding electrode are good or not based on a quantity of the supplied electric charges and a quantity of the electric charges output from the second electric charge holding electrode.
