A method and system are disclosed for comparing a data set to a baseline value for use in data analysis of the data set having a plurality of data points, the method comprising providing the data set to be analyzed, locating potentially bad data points in at least a portion of the data set using an odd-man out recursive technique, preparing a baseline set by discarding the potentially bad data points from the at least a portion of the data set and calculating a baseline value from the baseline set.
CROSS-REFERENCE TO RELATED APPLICATIONS
The present application claims priority of patent application Ser. No. CA 2,417,074 filed on Jan. 24, 2003 by Applicant and is a continuation of U.S. patent application Ser. No. 10/455,367 filed Jun. 6, 2003, now U.S. Pat. No. 7,039,554, the specifications of which are hereby incorporated by reference.
Method for detecting faults in a device comprising the steps of receiving a plurality of performance parameters, applying the plurality of performance parameters to a first model to produce a plurality of estimated performance parameters, applying the plurality of performance parameters to a second model to produce a plurality of estimated device parameters, computing a plurality of residuals from the plurality of estimated device parameters, computing a plurality of distance measuring from the plurality of residuals, detecting at least one parameter deviation using the plurality of residuals and the plurality of estimated performance parameters, and setting at least one detection flag if the detected at least one parameter deviation is persistent.
