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Mapping-measurement apparatus
 
   
Document Number
US Patent 7224460
Issued Date
May 29, 2007
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Abstract
A mapping-measurement apparatus includes a light illumination unit, a photodetector for detecting, through an aperture, reflection light or transmission light from a sample, and adjustable scanning mirrors on the illumination and detection sides of the sample, each mirror having two independent rotational axes about which they can be independently rotated by a controller. The aperture restricts light incident on the photodetector from a predetermined portion of the sample surface.
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Number of Claims:
6
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Owner
Jasco Corporation (Hachioji-shi, Tokyo,JP)
Published
May 29, 2007
Application Number
10/970,518
Filed
October 21, 2004
US Classification
356/444   356/445
Int'l Classification
G01N   21/00   (20060101)   G01N   21/55   (20060101)  
Assistant Examiner
Priority Data
Oct 24, 2003 [JP] 2003-364804
USPTO Field of Search
356/444   356/445  
Related Patents
7492460 - Attenuated-total-reflection measurement apparatus - Owned by Jasco Corporation (Hachioji-shi, Tokyo,JP)

The present invention provides an attenuated-total-reflection ("ATR") measurement apparatus that collects light onto a contact surface between a sample and an ATR prism at an incident angle greater than or equal to a critical angle and measures total-reflection light from the contact surface. The attenuated-total-reflection measurement apparatus according to the invention includes: a light-irradiating system for emitting the light which is collected onto the contact surface; a photodetector for detecting the total-reflection light from the contact surface; an aperture for restricting the light which the photodetector detects to only light from a specific measurement site in the contact surface; and a detection-side scanning mirror provided in a light path extending from the ATR prism to the aperture.

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