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Method for cancellation of the effect of charge feedthrough on CMOS pixel output
 
   
Document Number
US Patent 7242429
Issued Date
July 10, 2007
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Abstract
A method for determining a pixel output value of an imager; the imager having a plurality of pixels, a reset switch associated with each pixel and a select switch associated with each pixel; due to incident illumination upon a pixel of the imager after a reset period. The method captures a first pixel output value when the reset switch is OFF during a reset period and the select switch is ON during a reset period and captures a second pixel output value when the select switch is ON near an end of an integration period. If the second pixel output value is captured when the select switch is ON near an end of a first integration period, the first pixel output value may be captured when the reset switch is OFF during a reset period preceding the first integration period and the select switch is ON during a reset period preceding the first integration period. Moreover, if the second pixel output value is captured when the select switch is ON near an end of a first integration period, the first pixel output value may be captured when the reset switch is OFF during a reset period immediately following the first integration period and the select switch is ON during a reset period immediately following the first integration period.
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Number of Claims:
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Owner
SMAL Camera Technologies (Cambridge, MA)
Published
July 10, 2007
Application Number
10/335,677
Filed
January 2, 2003
US Classification
348/308   348/296 348/E3.021
Int'l Classification
H04N   3/14   (20060101)   H04N   5/335   (20060101)  
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Assistant Examiner
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Parent Case
PRIORITY INFORMATION This application claims priority, under 35 U.S.C. .sctn. 119, from U.S. Provisional Patent Application Ser. No. 60/345,780, filed on Jan. 3, 2002; the entire contents of which are hereby incorporated by reference.
USPTO Field of Search
348/308   348/296   348/297  
Related Patents
7528877 - Method and system for reducing mismatch between reference and intensity paths in analog to digital converters in CMOS active pixel sensors - Owned by Micron Technology, Inc. (Boise, ID)

A circuit for reducing a mismatch between a reference path to which a reference voltage is applied and an intensity path to which an intensity voltage is applied from an active pixel sensor comprises a first and a second pair of switches and a processing circuit. The first pair of switches couple an intensity input node to which the intensity voltage is applied to a first output node and couple a reference input node to which the reference voltage is applied to a second output node during a first operating period. The second pair of switches couple the intensity input node to the second output node and couple the reference input node to the first output node during a second operating period. A polarity reversing circuit is included in the processing circuit for coupling the first and second output nodes to the processing circuit with one polarity during the first operating period and in a reverse polarity during the second operating period.

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