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Method and apparatus for measuring delay time
 
   
Document Number
US Patent 7246019
Issued Date
July 17, 2007
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Inventors
Li; Jui-Ting (Taipei County,TW)
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Abstract
A method and apparatus for measuring a delay time is provided. First, a plurality of first/second phase signals, a first/second standard signal, and an inverse signal of the second standard signal are generated. The inverse signal of the second standard signal is applied to a second conductive line close to at least an adjacent conductive line. The first/second standard signal is applied to the first/second conductive line to obtain a first/second transmission signal. Then, the first/second transmission signal is sequentially sampled by the first/second phase signals to sequentially obtain a plurality of first/second sampling results. The first/second sampling results are sequentially identified by a first/second identifying level to obtain a first/second identification result. Accordingly, the delay time between the first and the second transmission signal may be obtained by comparing the different the second and the first identification result.
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Number of Claims:
10
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Owner
Published
July 17, 2007
Application Number
11/161,254
Filed
July 28, 2005
US Classification
702/79  
Int'l Classification
G01R   21/00   (20060101)  
Examiner
Assistant Examiner
Attorney/Law Firm
USPTO Field of Search
702/79  
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