Proposed is a method for programming and/or testing for the correct functioning of an electronic circuit, and a corresponding device, which is used to efficiently program and test electronic circuits combined on a wafer, prior to their separation. For this purpose, a bus allowing the individual electronic circuits to be sequentially tested is positioned on the wafer. Each electronic circuit is assigned an address for the bus, using a hardware code. The address is deactivated after completion of the functionality and testing method.
