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IBIST test for synchronous lines at multiple frequencies
 
   
Document Number
US Patent 7278077
Issued Date
October 2, 2007
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Abstract
A system for testing a synchronous link utilizing a single test pattern sequence. Components coupled via a link are each configured to generate and check test patterns according to a single repeated test pattern sequence. Test patterns which are generated are based upon two simple patterns. Each test cycle, a bit is chosen from one of the two patterns for use in generating the test pattern. A sixteen cycle test pattern sequence is utilized in which values are chosen from one or the other of the two patterns in a predetermined manner. In a bi-directional test, two components which are coupled via a link alternate driving selected values based upon the predetermined sequence. Each component may alternate driving sequences of one or more cycles. An ordering of cycles may be chosen to test various permutations of driver interaction between the respective components.
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IBIST test for synchronous lines at multiple frequencies - US Patent 7278077 Drawing
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Number of Claims:
19
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Owner
Sun Microsystems, Inc. (Santa Clara, CA)
Published
October 2, 2007
Application Number
10/689,265
Filed
October 20, 2003
US Classification
714/733  
Int'l Classification
G01R   31/28   (20060101)  
Examiner
Assistant Examiner
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