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Compositions for chemical mechanical polishing silica and silicon nitride having improved endpoint detection
   
Document Number
US Patent 7297633
Issued Date
November 20, 2007
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Abstract
The present invention provides a method of manufacturing a composition for polishing silica and silicon nitride on a semiconductor substrate. The method comprises ion-exchanging carboxylic acid polymer to reduce ammonia and combining by weight percent 0.01 to 5 of the ion-exchanged carboxylic acid polymer with 0.001 to 1 quaternary ammonium compound, 0.001 to 1 phthalic acid and salts thereof, 0.01 to 5 abrasive, and balance water.
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Compositions for chemical mechanical polishing silica and silicon nitride having improved endpoint detection - US Patent 7297633 Drawing
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Number of Claims:
14
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Published
November 20, 2007
Application Number
11/446,936
Filed
June 5, 2006
US Classification
438/692   216/89 252/79.4 438/693 438/700
Int'l Classification
H01L   21/302   (20060101)  
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USPTO Field of Search
438/692   438/693   438/700   252/79.4   216/89  
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