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Sampling apparatus and method for determining the driving state of a vehicle
   
Document Number
US Patent 7310593
Issued Date
December 18, 2007
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Abstract
An apparatus for determining a state parameter of an object to be monitored comprises a means for providing a plurality of measurement values, wherein the measurement values comprise information relating to the state parameter of the object to be monitored, a comparison means for comparing the measurement value to a predeterminable comparison parameter, wherein the comparison means is formed to output a first comparison signal when a predeterminable number of measurement values falls below the comparison parameter within a measurement interval, or to output a second comparison signal when the predeterminable number of measurement values exceeds or reaches the comparison parameter, wherein the first comparison signal or the second comparison signal indicate the state parameter.
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Number of Claims:
60
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Published
December 18, 2007
Application Number
11/072,099
Filed
March 4, 2005
US Classification
702/189  
Int'l Classification
G06F   15/00   (20060101)   H04B   15/00   (20060101)  
Assistant Examiner
Attorney/Law Firm
Priority Data
Mar 04, 2004 [DE] 10 2004 010 665
USPTO Field of Search
702/189  
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7472362 - Method of minimizing phase noise - Owned by International Business Machines Corporation (Armonk, NY)

A method of minimizing phase noise is provided. In operation, a first phase noise in a first circuit located on an integrated circuit is determined. Additionally, a second phase noise in a second circuit coupled to the first circuit but which is not located in the integrated circuit is determined, the second circuit being programmable. Further, the first phase noise is compared with the second phase noise. If the phase noises are about the same, it is determined that the noise source is from an algorithm of a random number generator, the second circuit is modified to optimize the performances of the integrated circuit, and the modified second circuit is copied to the first circuit. If the phase noises are different, it is determined that a source of the phase noise is at least one of a power supply coupling and a substrate coupling in the integrated circuit.

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