US Patent 7313743 - Hybrid scan-based delay testing technique for compact and high fault coverage test set

Hybrid scan-based delay testing technique for compact and high fault coverage test set

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Document Number

US Patent 7313743

Issued Date

December 25, 2007

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Inventors

Wang; Seongmoon (Plainsboro, NJ)

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Liu; Xiao (Blackburg, VA)

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Chakradhar; Srimat T. (Manalapan, NJ)

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Abstract

A scan-based method for testing delay faults in a circuit comprising controlling a subset of state inputs of the circuit by a skewed-load approach and controlling all inputs other than said subset of state inputs by a broad-side approach.

Owner

NEC Laboratories America, Inc (Princeton, NJ)

Published

December 25, 2007

Application Number

10/653,959

Filed

September 4, 2003

US Classification

714/726 714/729

Int'l Classification

G01R 31/317 (20060101) G01R 31/316 (20060101)

Examiner

Britt; Cynthia

Assistant Examiner

Gandhi; Dipakkumar

Attorney/Law Firm

Sughrue Mion Pllc.

USPTO Field of Search

714/726 714/729 714/733 714/25 714/727 713/193

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