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Process for manufacturing a triaxial piezoresistive accelerometer and relative pressure-monitoring device
 
   
Document Number
US Patent 7322236
Issued Date
January 29, 2008
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Abstract
A manufacturing process of a semiconductor piezoresistive accelerometer includes the steps of: providing a wafer of semiconductor material; providing a membrane in the wafer over a cavity; rigidly coupling an inertial mass to the membrane; and providing, in the wafer, piezoresistive transduction elements, that are sensitive to strains of the membrane and generate corresponding electrical signals. The step of coupling is carried out by forming the inertial mass on top of a surface of the membrane opposite to the cavity. The accelerometer is advantageously used in a device for monitoring the pressure of a tire of a vehicle.
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Number of Claims:
24
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Owner
STMicroelectronics S.r.l. (Agrate Brianza,IT)
Published
January 29, 2008
Application Number
11/338,614
Filed
January 24, 2006
US Classification
73/488   340/974 73/146
Int'l Classification
G01P   15/00   (20060101)  
Examiner
Priority Data
Jan 25, 2005 [EP] 05425028
USPTO Field of Search
73/146   73/488   340/974   216/13  
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7555956 - Micromechanical device having two sensor patterns - Owned by Robert Bosch GmbH (Stuttgart,DE)

A micromechanical device and a method for producing this device are provided, two sensor patterns being provided in the semiconductor material to record two mechanical variables, in particular the pressure and the acceleration. The functionality of both sensor patterns is based on the same predefined converter principle.

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