The pBIST solution to memory testing is a balanced hardware-software oriented solution. pBIST hardware provides access to all memories and other such logic (e.g. register files) in pipelined logic allowing back-to-back accesses. The approach then gives the user access to this logic through CPU-like logic in which the programmer can code any algorithm to target any memory testing technique required. Because hardware inside the chip is used at-speed, the full device speed capabilities are available. CPU-like hardware can be programmed and algorithms can be developed and executed after tape-out and while testing on devices in chip form is in process.
A fault diagnosis method for a semiconductor device in which a memory and a register are monolithically integrated is provided. The fault diagnosis method is composed of: first testing the memory with respect to a series of addresses to identify a first error address; externally outputting the first error address; storing the first error address into the register; second testing the memory with respect to a series of addresses; identifying a second error address different from the first error address using a result of the second testing and the first error address stored in the register; externally outputting the second error address; and updating the register to store the second error address.
