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Spectrophotometric system with reduced angle of incidence
   
Document Number
US Patent 7330256
Issued Date
February 12, 2008
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Inventors
Aho; Marc (Mountain View, CA)
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Abstract
A system uses reflectance spectrophotometry to characterize a sample having any number of structures. The system uses toroidal mirrors that are shaped in such a way that the angle of reflectance off of the target is small. The small angle of reflectance may allow for simplification of calculations and can result in a faster processing time. In addition, a more accurate measurement can be achieved when the reflected beam is close to normal.
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Number of Claims:
5
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Owner
n&k Technology, Inc. (Santa Clara, CA)
Published
February 12, 2008
Application Number
11/130,638
Filed
May 16, 2005
US Classification
356/319   356/445
Int'l Classification
G01J   3/42   (20060101)  
Assistant Examiner
USPTO Field of Search
356/319   356/445   356/237.5  
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