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Eye width characterization mechanism
   
Document Number
US Patent 7337380
Issued Date
February 26, 2008
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Inventors
Chow; Kim Kee (Bayan Lepas,MY)
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Abstract
An eye width characterization mechanism determines a pass setting of a sampling phase positioned within an eye width of received data. The sampling phase is incremented in a first direction from the pass setting until the sampling phase is outside the eye width of the received data. The sampling phase is then incremented in an opposite direction of the first direction starting again from the pass setting until the sampling phase is outside the eye width of the received data. The number of the sampling phase increments in the first direction is added to the number of the sampling phase increments in the opposite direction to characterize the eye width of the received data.
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Number of Claims:
8
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Owner
Intel Corporation (Santa Clara, CA)
Published
February 26, 2008
Application Number
11/710,534
Filed
February 23, 2007
US Classification
714/733  
Int'l Classification
G01R   31/28   (20060101)  
Parent Case
CROSS-REFERENCE TO RELATED APPLICATION The present application is a Divisional of U.S. patent application Ser. No. 10/930,202, filed on Aug. 31, 2004, now U.S. Pat. No. 7,225,370.
USPTO Field of Search
714/733  
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