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Image defect inspection method, image defect inspection apparatus, and appearance inspection apparatus
   
Document Number
US Patent 7346207
Issued Date
March 18, 2008
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Abstract
In an image defect inspection method and apparatus which detects a gray level difference between corresponding portions of two images, automatically sets a threshold value based on the distribution thereof, compares the gray level difference with the threshold value, and judges one or the other of the portions to be defective if the gray level difference is larger than the threshold value, provisions are made to correct the threshold value when the distribution of the gray level difference is different from the usual distribution, thereby achieving high detection sensitivity while suppressing the occurrence of false defects. To achieve this object, the cumulative frequency of the gray level difference is computed (S3); a converted cumulative frequency is computed by converting the cumulative frequency so that the cumulative frequency shows a linear relationship with respect to the gray level difference when the gray level difference is assumed to exhibit a distribution that obeys a prescribed type of distribution (S4); an approximation curve of the converted cumulative frequency is derived (S11); the second derivative of the approximation curve with respect to the gray level difference is computed (S12); and the threshold value is corrected in accordance with the second derivative (S13).
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Number of Claims:
21
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Published
March 18, 2008
Application Number
11/298,113
Filed
December 8, 2005
US Classification
382/145   382/149 382/168 382/169 382/172
Int'l Classification
G06K   9/00   (20060101)  
Assistant Examiner
Attorney/Law Firm
Priority Data
Jan 19, 2005 [JP] 2005-011420
USPTO Field of Search
382/149   382/168   382/169   382/172  
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