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Fault location on a telecommunications network
   
Document Number
US Patent 7359330
Issued Date
April 15, 2008
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Abstract
A fault location system for a telecommunications network including a local exchange or switch, a node such as a primary connection point and a plurality of line terminations includes probability calculation to establish the location of a fault measured from the exchange. Historical non-faulty reference values of capacitance are compiled for each line passing through the node providing a measure of the distance of each line. A lowest valid capacitance value provides an estimate of the reference capacitance between the exchange and the node. A histogram is compiled of historic fault values and a new fault is compared against the histogram to establish the probability of it being a fault at the node or elsewhere. As a result the reference capacitance can be obtained without the need for an engineer at the node, and the likely location of a fault can be pinpointed with greater accuracy.
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Number of Claims:
9
Comments:
no comments yet
Published
April 15, 2008
Application Number
10/220,430
Filed
March 5, 2001
US Classification
370/244   370/248 370/252 379/26.01
Int'l Classification
G01R   31/08   (20060101)  
Examiner
Assistant Examiner
Attorney/Law Firm
Priority Data
Mar 31, 2000 [GB] 0007835.2
USPTO Field of Search
379/22.03   379/25   379/24   379/27.01   370/242   370/248   324/519   324/658   324/525   324/659   324/665   324/666   324/669  
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A fault location system for a telecommunications network including a local exchange or switch, a node such as a primary connection point and a plurality of line terminations to the customer includes probability calculation to establish the location of a fault measuring from the exchange. Historical non-faulty reference values of capacitance are compiled for each line passing through the node providing a measure of the distance of each line. A lowest valid capacitance value provides an estimate of the reference capacitance between the exchange and the node. Using various parameters, probability tables are compiled of historic fault values and a new fault is compared against these tables to establish the probability of it being a fault at the node or elsewhere. As a result the reference capacitance can be obtained without the need for an engineer at the node, and the likely location of a fault can be pinpointed with greater accuracy.

Claims
Description
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