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Simultaneous switch test mode
   
Document Number
US Patent 7360129
Issued Date
April 15, 2008
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Abstract
The present invention provides a simultaneous switching (SS) test mode. SS test modules supporting an SS test mode are provided. When SS test mode is enabled, SS test mode data is driven on a data bus during an idle bus period. Otherwise, when SS test mode is disabled, no SS test mode data is driven on a data bus during an idle bus period.
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Number of Claims:
16
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Published
April 15, 2008
Application Number
10/747,276
Filed
December 30, 2003
US Classification
714/718   365/201 714/724
Int'l Classification
G11C   29/00   (20060101)   G01R   31/28   (20060101)   G11C   7/00   (20060101)  
Examiner
USPTO Field of Search
714/724  
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7590891 - Debugging circuit and a method of controlling the debugging circuit - Owned by Oki Semiconductor Co., Ltd. (Tokyo,JP)

In a debugging circuit and a controlling method of the debugging circuit, a mode judgment signal is generated which indicates that a central processing unit (CPU) is preparing to debug a predetermined program. Responsive to the mode judgment signal, a monitoring signal is generated indicative of an attempt by the CPU to execute the predetermined program during the debugging preparation. Furthermore, a transfer of an instruction code corresponding to the predetermined program is controlled so that the CPU is prevented from executing the predetermined program during the debugging preparation, responsive to the monitoring signal. Alternatively, in the debugging circuit and the method, instead of controlling the transfer of the instruction code responsive to the monitoring signal, another instruction code may be transferred to the CPU, responsive to the mode judgment signal. The another instruction code prevents the CPU from executing the predetermined program during the debugging preparation.

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