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Analysis of signal oscillation patterns
   
Document Number
US Patent 7362421
Issued Date
April 22, 2008
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Inventors
Pan; Gang (Maple Grove, MN)
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Abstract
A method for identifying and determining the frequency of scattered radiation fringe patterns for applications such as particle or droplet sizing and laser Doppler velocimetery. The method utilizes a series of windowed Fourier transforms performed on an intensity profile of the scattered radiation to locate a segment where a fringe pattern is located on the intensity profile. A standard Fourier transform is then performed on the segment to determine a dominant frequency of the fringe pattern, from which a physical quantity such as diameter or velocity of the particle or droplet may be derived. The method may be utilized with a line or an array sensor to measure the fringe patterns in a spatial domain, or with a point detector to measure the fringe patterns in the time domain.
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Number of Claims:
16
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Owner
TSI Incorporated (St. Paul, MN)
Published
April 22, 2008
Application Number
11/515,104
Filed
September 1, 2006
US Classification
356/28.5  
Int'l Classification
G01P   3/36   (20060101)  
Assistant Examiner
Parent Case
RELATED APPLICATION This application claims benefit of U.S. Provisional Application Ser. No. 60/713,790, filed Sep. 1, 2005, which is hereby fully incorporated herein by reference.
USPTO Field of Search
356/28.5  
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