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Measuring method and measuring apparatus utilizing attenuated total reflection
   
Document Number
US Patent 7365853
Issued Date
April 29, 2008
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Inventors
Sato; Shu (Kanagawa-ken,JP)
Ohtsuka; Hisashi (Kanagawa-ken,JP)
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Abstract
A measurement path is filled with air prior to performing actual measurement. A p-polarized light beam is caused to enter an interface, and the intensity distribution of the light beam reflected at the interface is detected by a photodiode array to obtain a reference intensity distribution of the light beam itself. Thereafter, the measurement path is filled with a target for measurement, and the intensity distribution of a light beam reflected at the interface is measured. Each of the measured distribution values are divided by the reference intensity distribution, to cancel out influences due to fluctuations in the intensity distribution of the light beam. Thereby, the position of an attenuated total reflection angle is detected with high accuracy. Because a light beam constituted by p-polarized light waves is utilized, separating means for separating the light beam reflected at the interface into p-polarized and s-polarized light waves becomes unnecessary.
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Number of Claims:
11
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Owner
Published
April 29, 2008
Application Number
11/239,305
Filed
September 30, 2005
US Classification
356/445  
Int'l Classification
G01N   21/55   (20060101)  
Assistant Examiner
Attorney/Law Firm
Priority Data
Sep 30, 2004 [JP] 2004-288105
USPTO Field of Search
356/445  
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