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System and method for estimating noise using measurement based parametric fitting non-uniformity correction
   
Document Number
US Patent 7391925
Issued Date
June 24, 2008
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Inventors
Olson; Teresa L. (Winter Garden, FL)
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Abstract
A system and method for estimating noise using measurement based parametric fitting non-uniformity correction is disclosed. Fixed pattern noise ("FPN") is estimating from an overall noise component within a detection system to enhance candidate target detection and tracking. A sensor in the detection system receives energy, such as radiant flux, that is converted to a digital image. A non-uniformity correction device generates an estimated FPN according to an applicable temperate range and integration time. A memory storing an array of coefficients is accessed to determine the estimated FPN. The valves within the array of coefficients are based on actual FPN measurements that are parametrically fitted.
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Number of Claims:
25
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Published
June 24, 2008
Application Number
10/727,039
Filed
December 4, 2003
US Classification
382/275   348/241 382/221 382/223
Int'l Classification
H04N   5/217   (20060101)  
Examiner
Assistant Examiner
USPTO Field of Search
348/241  
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