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Circuit and method for fuse disposing in a semiconductor memory device
   
Document Number
US Patent 7395475
Issued Date
July 1, 2008
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Abstract
A fuse disposing circuit executes a same test as in a state before a fuse is cut, even in case the fuse is cut. For this, the fuse disposing circuit in accordance with the invention includes a test mode enable confirmation section for informing whether a test mode is enabled; and a fuse set for providing a constant signal by using the output from the test mode enable confirmation section in case of the test mode, regardless of elimination or non-elimination of a fuse.
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Number of Claims:
9
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Owner
Hynix Semiconductor, Inc. (Kyoungki-Do,KR)
Published
July 1, 2008
Application Number
10/876,210
Filed
June 23, 2004
US Classification
714/734   365/201 365/225.7 365/96 702/117 702/118 702/120 702/35 702/59 714/25 714/30 714/703 714/709 714/718 714/719 714/724 714/733 714/745 714/818
Int'l Classification
G01R   31/28   (20060101)  
Priority Data
Dec 01, 2003 [KR] 10-2003-0086424
USPTO Field of Search
714/719  
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