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Substrate structure and manufacturing method of the same
   
Document Number
US Patent 7417320
Issued Date
August 26, 2008
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Abstract
A Ti film is pattern-formed on a desired portion on a silicon substrate, and a Co film is formed on the substrate so as to cover the Ti film. CNTs are formed only on a portion, under which the Ti film is formed, of the surface of the Co film at approximately 600.degree. C. by a thermal CVD method. The length of the CNT can be controlled by adjusting the thickness of the Ti film.
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Number of Claims:
13
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Owner
Fujitsu Limited (Kawasaki,JP)
Published
August 26, 2008
Application Number
11/180,584
Filed
July 14, 2005
US Classification
257/774   257/E51.04 977/743
Int'l Classification
H01L   23/48   (20060101)   H01L   23/52   (20060101)   H01L   29/40   (20060101)  
Examiner
Assistant Examiner
Attorney/Law Firm
Priority Data
Aug 31, 2004 [JP] 2004-252752 Mar 30, 2005 [JP] 2005-098875
USPTO Field of Search
257/E51.04  
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