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Apparatus and method for three-dimensional measurement and program for allowing computer to execute method for three-dimensional measurement
   
Document Number
US Patent 7436524
Issued Date
October 14, 2008
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Abstract
The present invention has a three-dimensional apparatus including a lattice pattern placed in an optical path and having a slit-like light transmitting portion formed of pitches set at fixed intervals, and a projecting optical system that projects a lattice pattern image formed by the lattice pattern on the sample so that the image is inclined at a predetermined angle. A lattice pitch is determined on the basis of set parameters including the magnification of an observing system. A pattern is formed by the lattice pitch. The pattern is used to pick up a deformed lattice pattern image using a TV camera. An image of each position is acquired while shifting the lattice pattern over several levels. A phase is determined. A height is then determined using the difference between the phase and a basic phase corresponding to a pre-provided magnification or the like. The height is then displayed.
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Number of Claims:
16
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Owner
Published
October 14, 2008
Application Number
11/286,068
Filed
November 23, 2005
US Classification
356/603   356/601
Int'l Classification
G01B   11/24   (20060101)  
Examiner
Assistant Examiner
Priority Data
Nov 26, 2004 [JP] 2004-342497 Nov 29, 2004 [JP] 2004-344192 Sep 20, 2005 [JP] 2005-271761
USPTO Field of Search
356/600   356/601   356/602   356/603   356/604   356/605   356/606   356/607   356/608   356/609   356/610   356/611   356/612   356/613  
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