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Defect inspection method and defect inspection system using the method
   
Document Number
US Patent 7446864
Issued Date
November 4, 2008
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Abstract
A surface of a work to be inspected is irradiated with an illumination unit for a coaxial incident illumination and an illumination unit for an oblique incident illumination driven to take its image by a camera at the same time. Each of the illumination units and comprises light sources emitting color lights R, G and B, respectively. One of the three kinds of light sources is lighted in the illumination unit and one or two of the light sources which are not lighted in the illumination unit are lighted in the illumination unit.
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Number of Claims:
6
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Owner
Omron Corporation (Kyoto-Shi,JP)
Published
November 4, 2008
Application Number
11/398,763
Filed
April 6, 2006
US Classification
356/237.1  
Int'l Classification
G01N   21/00   (20060101)  
Assistant Examiner
Attorney/Law Firm
Priority Data
Apr 08, 2005 [JP] P2005-111536 Mar 08, 2006 [JP] P2006-062505
USPTO Field of Search
356/237.1  
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