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Apparatus and method for using variable end state delay to optimize JTAG transactions
 
   
Document Number
US Patent 7457986
Issued Date
November 25, 2008
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Inventors
Hoar; Henry R. (Missouri City, TX)
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Abstract
In a JTAG test and debug environment, the parameters that are accessed by command include a delay parameter. The delay parameter prevents the subsequent command from being executed until both the original command has been executed and the clock cycles indicated by the delay parameter have been completed. Because the time delay is included as a parameter identified by the command, the delay parameter can be programmed.
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Number of Claims:
15
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Published
November 25, 2008
Application Number
10/943,191
Filed
September 16, 2004
US Classification
714/30   714/E11.166
Int'l Classification
G06F   11/00   (20060101)  
Assistant Examiner
Parent Case
This application claims priority under 35 USC .sctn.119(e)(1) of Provisional Application No. 60/517,537 (TI-36182P) filed Nov. 05, 2003.
USPTO Field of Search
714/30  
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