Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuit
The electronic test circuit for an integrated circuit to be tested has an input for receiving an analog data stream (23), a programmable digital line emulator (TPE.sub.1) for emulating properties of a transmission path and an output for emitting an analog data stream (24) having a signal-to-noise ratio which can be adjusted using the programmable digital line emulator (TPE.sub.1).
CROSS-REFERENCE TO RELATED APPLICATION
This application is a continuation of co-pending International Application No. PCT/DE2005/001184 filed Jul. 5, 2005, which designates the United States, and claims priority to German application number DE 10 2004 034 606.2 filed Jul. 16, 2004.
