A solid state imaging device comprises: photoelectrical converting elements arranged on a semiconductor substrate in a row direction and a column direction substantially perpendicular to each other, wherein charges are accumulated in said photoelectrical converting elements; and a plurality of output sections that output signals corresponding to accumulated charges, said photoelectrical converting elements being arranged in an area that is divided into blocks that correspond to said output sections, wherein said blocks include respective correction areas having a corresponding plurality of sets of correction photoelectrical converting elements used in calculating correction data for correcting output dispersions of said output sections, said correction areas include respective continuous areas that are continuous to each other in a boundary between the plurality of blocks, and an obscuring member, positioned above said continuous areas, that obscures an object image formed in each of said continuous areas.
