During testing of an integrated circuit (IC), a channel masking capability is used for masking out unknown or unpredictable (X) values from being compressed into a signature register. The approach provides flexibility to allow for masking of unknown values, while avoiding many of the problems caused by over-masking of known values. The circuitry added to the design to allow for masking is reasonably small, and provides an effective way of masking unknown values during the testing process.
CROSS-REFERENCED AND RELATED APPLICATIONS
This application claims the benefit of U.S. Provisional Application 60/503,191, filed on Sep. 15, 2003 which is hereby incorporated by reference as if fully set forth herein.
