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Two-pass sliding compaction
 
   
Document Number
US Patent 7533228
Issued Date
May 12, 2009
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Abstract
During two-pass sliding compaction, a heap may first be logically divided into fixed-sized segments, or chunks, and information regarding each chunk, known as per-chunk metadata, may be saved for use during the second, sliding phase. In addition to the per-chunk information, information regarding the location and size, called object extent information, may also be saved during the marking phase of two-pass sliding compaction. In the sliding phase of two-pass sliding compaction, live objects are moved to their respective destinations in the heap after first updating any object references in the objects. The order of objects being moved may be maintained across heap compaction. By relying upon the per-chunk and object extent information saved during the marking phase, objects may be processed individually and independent of each other during the sliding phase, according to some embodiments.
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Number of Claims:
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Owner
Sun Microsystems, Inc. (Santa Clara, CA)
Published
May 12, 2009
Application Number
11/139,292
Filed
May 27, 2005
US Classification
711/159  
Int'l Classification
G06F   12/12   (20060101)  
Examiner
Assistant Examiner
USPTO Field of Search
711/159  
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