A semiconductor apparatus generates a clock signal used for scan test on an internal circuit of the semiconductor apparatus. The semiconductor apparatus includes a scan chain for performing input and output of data in the internal circuit, a clock generator for generating a launch clock signal for sending data to the internal circuit and a capture clock signal for capturing data from the internal circuit. The launch clock signal and the capture clock signal are generated based on a plurality of clock signals having different phases, and a pulse width of the plurality of clock signals is smaller than half of a cycle of the plurality of clock signals.
