A system and method of correcting reflectance comprises determining a reflectance constant for a test product at a first wavelength for which reflectance does not substantially change with the presence of a test substance, with the test product loaded with the test substance, determining a reflectance at a second wavelength for which signal-to-noise ratio is maximized and determining a measured reflectance at the first wavelength, and determining a corrected reflectance as the product of the reflectance with a ratio of the reflectance constant to the measured reflectance.
CROSS REFERENCES TO RELATED APPLICATIONS
This application claims the benefit of priority under 35 U.S.C. .sctn. 119(e) from co-pending, commonly owned U.S. provisional patent application Ser. No. 60/508,830, entitled Method For Increasing Precision Of Reflectance Measurements, filed Oct. 3, 2003.
