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Spectrophotometer with wide inlet slit
   
Document Number
US Patent 7564560
Issued Date
July 21, 2009
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Abstract
A spectrophotometer incorporating an interferometer and a dispersive system is adapted to have an enlarged inlet field without degrading its spatial resolution. To this end, spectral data deduced horn measurements performed by means of the interferometer are transferred into spectral data deduced from measurements per formed by means of the dispersive system. Such spectrophotometer makes it possible to scan an observation field quickly, and is compatible with use on board a satellite.
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Number of Claims:
8
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Owner
Astrium SAS (Paris,FR)
Published
July 21, 2009
Application Number
11/564,455
Filed
November 29, 2006
US Classification
356/451  
Int'l Classification
G01B   9/02   (20060101)   G01J   3/45   (20060101)  
Examiner
Attorney/Law Firm
Priority Data
Dec 01, 2005 [FR] 05 12209
USPTO Field of Search
356/319   356/323   356/324   356/451   356/456  
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