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Peak pattern evaluation using spring model
   
Document Number
US Patent 7574328
Issued Date
August 11, 2009
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Abstract
Determining a property of a measured peak pattern having at least one peak includes extracting measured peak parameters from the measured peak pattern, and determining deviations of the measured peak parameters from reference values of a reference peak pattern. The reference peak pattern is represented by a spring model, with peak parameters being represented by corresponding springs. Determining a property of a measured peak pattern also includes determining a deformation energy necessary for deforming the reference peak pattern in a way that the deformed reference peak pattern substantially represents the measured peak pattern.
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Number of Claims:
14
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Owner
Agilent Technologies, Inc. (Santa Clara, CA)
Published
August 11, 2009
Application Number
11/299,160
Filed
December 9, 2005
US Classification
702/193  
Int'l Classification
G06F   15/00   (20060101)  
Assistant Examiner
Priority Data
Dec 10, 2004 [EP] 04106453
USPTO Field of Search
702/193   702/19   702/21   702/23   702/24   702/25   702/27   702/33   702/44   702/189   703/2   703/7   703/9   703/11  
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