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Testing/adjusting method and test control apparatus for rotating disk storage devices
 
   
Document Number
US Patent 7584070
Issued Date
September 1, 2009
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Inventors
Kotani; Yasuhiro (Kanagawa-ken,JP)
Suzuki; Hiroaki (Kanagawa-ken,JP)
Takase; Makoto (Kanagawa-ken,JP)
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Abstract
Embodiments of the invention provide a method of testing/adjusting magnetic disk devices, in which the method allows the tests/adjustments to be conducted by solving problems due to the data sizes and characteristics of test/adjustment programs. After assembly of a magnetic disk device, setup of various parameters, magnetic disk defect registration, and other test/adjustment steps are executed. Execution of the test/adjustment programs does not require a special test apparatus since they are executed in the magnetic disk device to be tested. In addition, the test/adjustment programs are formed up of multiple phases, and each phase is sequentially executed. Adoption of this program structure keeps the tests/adjustments clear from restrictions due to the data sizes and characteristics of the test/adjustment programs.
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Number of Claims:
12
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Published
September 1, 2009
Application Number
11/177,028
Filed
July 7, 2005
US Classification
702/115   356/507 365/222 702/119
Int'l Classification
G01L   25/00   (20060101)  
Examiner
Priority Data
Jul 07, 2004 [JP] 2004-200347
USPTO Field of Search
702/115   702/118   702/119   702/121   702/123   360/51   360/69   360/73.02   360/78.04   29/603.01   29/603.03   29/603.09   712/244   365/222   356/507  
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