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System and method for self-referenced SPR measurements
 
   
Document Number
US Patent 7586614
Issued Date
September 8, 2009
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Abstract
A system and method of using a refractive index sensor to determine a characteristic of a sample. The operation of the system and method allow for determining a change in a bulk index of the sample, and an amount of sample adsorption, using a reflected beam from an interface of the sensor. An embodiment of a system and method further provide for identifying changes in incident angles determine from reflective measurement data of the sensor, in combination with different proportionality constants of the refractive index sensor to determine a characteristic of the sample.
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Number of Claims:
21
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Owner
Agilent Technologies, Inc. (Santa Clara, CA)
Published
September 8, 2009
Application Number
11/210,633
Filed
August 24, 2005
US Classification
356/445   436/34
Int'l Classification
G01N   21/43   (20060101)  
Assistant Examiner
USPTO Field of Search
356/445  
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